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English

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Far-infrared optically detected cyclotron resonance in GaAs layers and low â€“ dimensional structures Semiconductor

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Far-infrared optically detected cyclotron resonance in GaAs layers and low â€“ dimensional structures Semiconductor
1992

Semicon. & Technology 7 (1992) 357- 363.

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Switching surface design via linear matrix inequality and Ackermannâ€™s formula for a linearized inverted pendulum system
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11 January 2022
Determinants of Factors Impacting Buying Intention towards E- Retailing: A Special Reference to Jordan Context
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2022
Preparation of the scattering Layer based on Ti Nanotube and their sensitized Solar Cell Applications
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2017
Improving the Photoresponse of porous Silicon for Solar Cell Applications by Embedding of CdTe Nanoparticles
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The effect of Ga-doped Cdseproperties prepared by thermal evaporation.
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2017

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